In Situ Transmission Electron Microscopy and Ion Irradiation of Ferritic Materials
In Situ Transmission Electron Microscopy and Ion Irradiation of Ferritic Materials
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DOI：
10.1002/jemt.20670
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发表时间：
2009-03-01
影响因子：
2.5
通讯作者：
Motta, Arthur T.
中科院分区：
文献类型：
--
作者：
Kirk, Marquis A.;Baldo, Peter M.;Motta, Arthur T.
介绍了阿贡国家实验室电子显微镜中心的中压电子显微镜-串联用户设备。该设备的主要目的是在受控样品温度下进行原位离子辐照的电子显微镜。为了说明它的能力和优势的一些结果的两个外部用户项目。离子辐照过程中形成的位错环的运动在视频数据中示出，其揭示了Fe-8%Cr中的运动比纯铁中的运动显著减少。扩展的缺陷结构的发展，然后示出依赖于这种运动和附近的表面的影响，在透射电子显微镜薄样品。在第二个项目中，在氧化物弥散强化铁素体合金中，在500摄氏度下，在高剂量（200 dpa）下观察到的损伤微观结构，并发现与在420摄氏度下中子辐照的相同合金中观察到的损伤微观结构定性相似。Microsc. Res. Tech. 72：182-186，2009. (C)2009威利-利斯公司
The intermediate voltage electron microscope-tandem user facility in the Electron Microscopy Center at Argonne National Laboratory is described. The primary purpose of this facility is electron microscopy with in situ ion irradiation at controlled sample temperatures. To illustrate its capabilities and advantages a few results of two outside user projects are presented. The motion of dislocation loops formed during ion irradiation is illustrated in video data that reveals a striking reduction of motion in Fe-8%Cr over that in pure Fe. The development of extended defect structure is then shown to depend on this motion and the influence of nearby surfaces in the transmission electron microscopy thin samples. In a second project, the damage microstructure is followed to high dose (200 dpa) in an oxide dispersion strengthened ferritic alloy at 500 degrees C, and found to be qualitatively similar to that observed in the same alloy neutron irradiated at 420 degrees C. Microsc. Res. Tech. 72:182-186, 2009. (C) 2009 Wiley-Liss, Inc.