Yield improvement using configurable analogue transistors
Yield improvement using configurable analogue transistors
复制标题
使用可配置模拟晶体管提高产量
DOI:
10.1049/el:20081409
复制
发表时间:
2008
影响因子:
1.1
通讯作者:
Wilson P
中科院分区:
文献类型:
--
作者:
Wilson P
Continued process scaling has led to significant yield and reliability challenges for today’s designers. Analogue circuits are particularly susceptible to poor variation, driving the need for new yield resilient techniques in this area. A new configurable analogue transistor structure and supporting methodology that facilitates variation compensation at the post-manufacture stage is described. The approach has demonstrated significant yield improvements and can be applied to any analogue circuit.