Ewald sphere correction for single-particle electron microscopy
Ewald sphere correction for single-particle electron microscopy
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DOI：
10.1016/j.ultramic.2005.11.001
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发表时间：
2006-03-01
期刊：
影响因子：
2.2
通讯作者：
Grigorieff, N
中科院分区：
文献类型：
--
作者：
Wolf, M;DeRosier, DJ;Grigorieff, N
大多数从电子显微照片进行三维（3D）重建的算法都假定图像对应于三维结构的投影。当结构的尺寸超过显微镜的景深时，这种近似限制了重建的可达到的分辨率。我们已经开发了两种方法来计算校正景深的重建。应用于代表大型病毒的合成数据的任何一种方法都比缺乏此校正的方法产生更高的分辨率重建。(c) 2005 Elsevier B.V.版权所有
Most algorithms for three-dimensional (3D) reconstruction from electron micrographs assume that images correspond to projections of the 3D structure. This approximation limits the attainable resolution of the reconstruction when the dimensions of the structure exceed the depth of field of the microscope. We have developed two methods to calculate a reconstruction that corrects for the depth of field. Either method applied to synthetic data representing a large virus yields a higher resolution reconstruction than a method lacking this correction. (c) 2005 Elsevier B.V. All rights reserved.