Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging
Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging
复制标题
用于亚微米分辨率磁成像的扫描约瑟夫森结显微镜的设计
DOI：
10.1063/1.1150077
复制
发表时间：
1999
影响因子：
1.6
通讯作者：
D. Harlingen
中科院分区：
文献类型：
--
作者：
B. Plourde;D. Harlingen
我们描述了一种磁场扫描仪器，旨在将扫描超导量子干涉装置显微镜的空间分辨率扩展到亚微米范围。该仪器是扫描约瑟夫森结显微镜，可扫描样品表面的单个约瑟夫森结，通过调制结临界电流来检测局部磁场。通过使用亚微米结和扫描隧道显微镜反馈系统来保持与表面的紧密接近，应可实现 10 μG 的磁场灵敏度和 0.3 μm 的空间分辨率，这为超导体中的涡旋结构和核心结构以及磁性材料中的磁畴的成像提供了新的机会。
We describe a magnetic field scanning instrument designed to extend the spatial resolution of scanning superconducting quantum interference device microscopy into the submicron regime. This instrument, the scanning Josephson junction microscope, scans a single Josephson junction across the surface of a sample, detecting the local magnetic field by the modulation of the junction critical current. By using a submicron junction and a scanning tunneling microscope feedback system to maintain close proximity to the surface, magnetic field sensitivity of 10 μG with a spatial resolution of 0.3 μm should be attainable, opening up new opportunities for imaging vortex configurations and core structure in superconductors and magnetic domains in magnetic materials.