Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images
Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images
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DOI：
10.1016/j.ultramic.2014.01.010
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发表时间：
2014-10-01
期刊：
影响因子：
2.2
通讯作者：
Kaiser, U.
中科院分区：
文献类型：
--
作者：
Lee, Z.;Rose, H.;Kaiser, U.
为了在像差校正（AC）高分辨率透射电子显微镜（HRTEM）图像中实现最高分辨率，需要仅少数样品能够承受的高电子剂量。在本文中，我们进行了剂量相关的AC-HRTEM图像计算，并研究了信噪比，原子对比度和分辨率的电子剂量和采样的依赖关系。我们介绍了剂量依赖的对比度，它可以用来评估在不同的剂量条件下的对象的可见性。根据我们的计算，我们确定最佳采样高和低电子剂量成像条件。(C)2014 Elsevier B. V.保留所有权利，
In order to achieve the highest resolution in aberration-corrected (AC) high-resolution transmission electron microscopy (HRTEM) images, high electron doses are required which only a few samples can withstand. In this paper we perform dose-dependent AC-HRTEM image calculations, and study the dependence of the signal-to-noise ratio, atom contrast and resolution on electron dose and sampling. We introduce dose-dependent contrast, which can be used to evaluate the visibility of objects under different dose conditions. Based on our calculations, we determine optimum samplings for high and low electron dose imaging conditions. (C) 2014 Elsevier B.V. All rights reserved,