Birefringence measurements by an electro-optic modulator using a new heterodyne scheme
Birefringence measurements by an electro-optic modulator using a new heterodyne scheme
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使用新外差方案的电光调制器进行双折射测量
DOI：
10.1117/1.1512908
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发表时间：
2002
影响因子：
1.3
通讯作者：
P. Hsu
中科院分区：
文献类型：
--
作者：
Y. Lo;P. Hsu
提出了一种在共光路干涉仪(旋光仪)中通过调制电光调制器在正弦信号中测量双折射(或延迟)变化的新方法。因此，可以用新的外差方案来形成标准外差信号，并且随后通过锁定放大器或相位计来解调关于双折射变化的相移。与传统技术相比，该技术提供了更容易的设置、更宽的调制频率，从而在传感系统中提供了更宽的频率响应。最后，首次提出了一种基于电光调制器和外差方案的共光路干涉仪双折射测量方法。
A new method for measuring changes in birefringence (or retardation) by modulating an electro-optic (EO) modulator in a sine-wave signal is developed in a common-path interferometer (polarimeter). The standard heterodyne signal, therefore, can be formed with a new heterodyne scheme, and subsequently the phase shift regarding to changes in birefringence is demodulated by a lock-in amplifier or phase meter. As compared to the conventional techniques, this technique supplies an easier setup, wider modulated frequency, and therefore, a wider frequency response in a sensing system. Finally, the birefringence measurement based on an EO modulator and a new heterodyne scheme in a common-path interferometer is first demonstrated.