Microgeometry Capture using an Elastomeric Sensor
Microgeometry Capture using an Elastomeric Sensor
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DOI：
10.1145/1964921.1964941
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发表时间：
2011-07-01
影响因子：
6.2
通讯作者：
Adelson, Edward H.
中科院分区：
文献类型：
--
作者：
Johnson, Micah K.;Cole, Forrester;Adelson, Edward H.
我们描述了一种用于捕获微观表面几何形状的系统。该系统将逆行传感器 [Johnson 和 Adelson 2009] 扩展到微观领域，展示了小至 2 微米的空间分辨率。与现有的微观几何捕获技术相比，该系统不受被测表面光学特性的影响，无论物体是无光泽、有光泽还是透明，它都能捕获相同的几何形状。此外，硬件设计允许多种外形尺寸，包括可用于在现场捕获高分辨率表面几何形状的手持设备。与 Johnson 和 Adelson [2009] 的原始传感器相比，我们通过结合改进的传感器材料、照明设计和重建算法来实现这些结果。
We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured-it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson [2009].