Synthetic Data for Deep Learning: Segmentation of PCB X-Ray Images
Synthetic Data for Deep Learning: Segmentation of PCB X-Ray Images
复制标题
用于深度学习的合成数据:PCB X 射线图像的分割
DOI:
10.1093/micmic/ozad067.979
复制
发表时间:
2023
影响因子:
2.8
通讯作者:
Tavousi, Pouya
中科院分区:
文献类型:
--
作者:
Phoulady, Adrian;Choi, Hongbin;May, Nicholas;Shahbazmohamadi, Sina;Tavousi, Pouya
Reverse engineering, defect analysis, and inspection are important tasks in the field of electronic devices. In the process of electronic device inspection, X-ray imaging has proven to be one of the most effective non-destructive techniques for obtaining a 3D view of the sample with good resolution. However, the data obtained by X-ray imaging is generally large, and manual inspection of the data can be a time-consuming task. To overcome this challenge, an automatic segmentation system can be implemented to assist with the inspection.In order to inspect a printed circuit board (PCB), the board should first be segmented to differentiate between copper and other materials in the PCB, such as glass fiber. Different image processing techniques can be used for this task, including Otsu’s thresholding [1], active contour models [2], and k-means clustering [3]. While these methods are capable of effectively segmenting the circuits in a PCB X-ray scan, there is still a significant challenge in accurately differentiating between nodes and connections in order to automatically extract the net list.