Defect-induced Raman scattering in resonance with yellow luminescence transitions in hexagonal GaN on a sapphire substrate
Defect-induced Raman scattering in resonance with yellow luminescence transitions in hexagonal GaN on a sapphire substrate
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蓝宝石衬底上六方氮化镓中缺陷引起的拉曼散射与黄色发光跃迁的共振
DOI:
10.1063/1.120738
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发表时间:
1998
期刊:
影响因子:
--
通讯作者:
H. Riechert
中科院分区:
文献类型:
--
作者:
D. Jiang;M. Ramsteiner;K. Ploog;H. Tews;A. Graber;R. Averbeck;H. Riechert
Strong defect-specific low-frequency peaks are detected in low-temperature Raman spectra of hexagonal GaN grown by molecular beam epitaxy on sapphire substrate. The intensity of these peaks is found to be enhanced by excitation in resonance with yellow luminescence transitions. The validity of the assignment to electronic Raman scattering (ERS), as proposed before for their counterparts in cubic GaN on GaAs [M. Ramsteiner, J. Menniger, O. Brandt, H. Yang, and K. H. Ploog, Appl. Phys. Lett. 69, 1276 (1996)], is confirmed. Our results imply that the observed ERS peaks are related to shallow donors which are not necessarily hydrogenic. One Raman peak at very low frequency (11.7 meV) is alternatively explained by a pseudo-localized vibrational mode.