Measurement of the unstained biological sample by a novel scanning electron generation X-ray microscope based on SEM
Measurement of the unstained biological sample by a novel scanning electron generation X-ray microscope based on SEM
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DOI：
10.1016/j.bbrc.2009.05.107
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发表时间：
2009-08-07
影响因子：
3.1
通讯作者：
Ogura, Toshihiko
中科院分区：
文献类型：
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作者：
Ogura, Toshihiko
我们介绍了一种基于薄膜扫描电子显微镜的新型X射线显微镜系统，它可以对未染色的生物样品进行无损测量。所有未染色的酵母样品被吸附在90 nm厚的氮化硅(Si(3)N(4))膜下。通过放置在样品下方的X射线光电二极管(PD)检测来自胶片的X射线信号。在加速2.6kV、电流6.75nA的All电子束作用下，用X射线PD获得了酵母图像。这幅图像是由钛层的软X射线创建的。钛层能有效地通过电子辐照产生波长为2.7 nm的特征X射线。此外，我们还用蒙特卡罗模拟方法研究了钛包覆的Si(3)N(4)薄膜中的电子轨迹和特征X射线的产生。我们的系统可以很容易地用来观察各种未染色的细胞、细菌和病毒的生物样本。(C)2009 Elsevier Inc.保留所有权利。
We introduced a novel X-ray microscope system based on scanning electron Microscopy Using thin film, which enables the measurement Of unstained biological samples without damage. Ail unstained yeast sample was adsorbed under a titanium (Ti)-coated silicon nitride (Si(3)N(4)) film 90 nm thick. The X-ray signal from the film was detected by an X-ray photodiode (PD) placed below the sample. With ail electron beam at 2.6 kV acceleration and 6.75 nA current, the yeast image is obtained Using the X-ray PD. The image is created by soft X-rays from the Ti layer. The Ti layer is effective in generating the characteristic 2.7-nm wavelength X-rays by the irradiation of electrons. Furthermore, we investigated the electron trajectory and the generation of the characteristic X-rays within the Ti-coated Si(3)N(4) film by Monte Carlo simulation. Our system can be easily utilized to observe various unstained biological samples of cells, bacteria, and viruses. (C) 2009 Elsevier Inc. All rights reserved.