Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing

Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing
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DOI：
10.1145/1278480.1278615
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发表时间：
2007-06
期刊：
2007 44th ACM/IEEE Design Automation Conference
影响因子：
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通讯作者：
X. Wen;K. Miyase;Tatsuya Suzuki;S. Kajihara;Yuji Ohsumi;K. Saluja
X. Wen;K. Miyase;Tatsuya Suzuki;S. Kajihara;Yuji Ohsumi;K. Saluja
中科院分区：
其他
文献类型：
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作者：
X. Wen;K. Miyase;Tatsuya Suzuki;S. Kajihara;Yuji Ohsumi;K. Saluja

文献摘要

被引文献

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IR压降引起的故障主要是由于全速扫描测试的捕获周期中激活的关键路径上的时序违规引起的。提出了一种关键路径感知的X填充方法，用于减小IR压降，特别是在靠近激活的关键路径的门上，从而有效地防止测试引起的成品率损失。
IR-drop-induced malfunction is mostly caused by timing violations on activated critical paths during the capture cycle of at-speed scan testing. A critical-path-aware X-filling method is proposed for reducing IR-drop, especially on gates that are close to activated critical paths, thus effectively preventing test-induced yield loss.