Smart Wide-field Fluorescence Lifetime Imaging System with CMOS Single-photon Avalanche Diode Arrays.
Smart Wide-field Fluorescence Lifetime Imaging System with CMOS Single-photon Avalanche Diode Arrays.
复制标题
具有 CMOS 单光子雪崩二极管阵列的智能宽视场荧光寿命成像系统。
DOI：
10.1109/embc48229.2022.9870996
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发表时间：
2022
期刊：
影响因子：
--
通讯作者：
Xiao D
中科院分区：
文献类型：
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作者：
Xiao D
宽场荧光寿命成像（FLIM）是一种具有广泛应用前景的生物医学和临床技术。与CMOS单光子雪崩二极管（SPAD）传感器阵列集成可以导致更便宜和便携式实时FLIM系统。然而，由这样的传感器系统获得的FLIM数据通常具有复杂的噪声特征。仍然缺乏快速的工具来有效地从高度噪声破坏的荧光信号中恢复寿命参数。本文提出了一种智能宽场FLIM系统，该系统包含一个COMS SPAD传感器和一个现场可编程门阵列（FPGA）嵌入式深度学习（DL）FLIM处理器。该处理器采用硬件友好的轻量级神经网络进行荧光寿命分析，具有抗噪声精度高、速度快、功耗低等优点。实验结果表明，该系统的上级和强大的性能，有前途的许多FLIM应用，如FLIM引导的临床手术，癌症诊断，生物医学成像。
Wide-field fluorescence lifetime imaging (FLIM) is a promising technique for biomedical and clinic applications. Integrating with CMOS single-photon avalanche diode (SPAD) sensor arrays can lead to cheaper and portable real-time FLIM systems. However, the FLIM data obtained by such sensor systems often have sophisticated noise features. There is still a lack of fast tools to recover lifetime parameters from highly noise-corrupted fluorescence signals efficiently. This paper proposes a smart wide-field FLIM system containing aCOMS SPAD sensor and a field-programmable gate array (FPGA) embedded deep learning (DL) FLIM processor. The processor adopts a hardware-friendly and light-weighted neural network for fluorescence lifetime analysis, showing the advantages of high accuracy against noise, fast speed, and low power consumption. Experimental results demonstrate the proposed system's superior and robust performances, promising for many FLIM applications such as FLIM-guided clinical surgeries, cancer diagnosis, and biomedical imaging.