Atomic force microscopy to detect internal live processes in insects
Atomic force microscopy to detect internal live processes in insects
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DOI：
10.1063/1.3273371
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发表时间：
2010-01-25
影响因子：
4
通讯作者：
Sokolov, I.
中科院分区：
文献类型：
--
作者：
Dokukin, M. E.;Guz, N. V.;Sokolov, I.
在这里，我们报告使用原子力显微镜(AFM)来研究来自昆虫内部活体过程的表面振荡。通过特别设计的AFM工作台，使昆虫的运动受到部分限制，AFM可以记录昆虫不同部位的内部振荡。我们演示了苍蝇、蚊子和瓢虫的方法。我们发现原子力显微镜可以提供迄今还没有研究过的光谱行为的信息，在10-600赫兹的范围内，探测幅度可以降到亚纳米级。
Here we report on the use of atomic force microscopy (AFM) to study surface oscillations coming from internal live processes of insects. With a specially designed AFM stage to keep an insect motion partially restricted, the AFM can record internal oscillations on different parts of the insect. We demonstrate the method for a fly, mosquito, and lady beetle. We show that AFM can provide information about the spectral behavior that has not been studied so far, 10-600 Hz range, detecting amplitudes down to subnanometer level.