Closed-Form Expressions for I/O Simultaneous Switching Noise Revisited
Closed-Form Expressions for I/O Simultaneous Switching Noise Revisited
复制标题
重新审视 I/O 同时开关噪声的封闭式表达式
DOI：
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发表时间：
2017
影响因子：
2.8
通讯作者：
E. Salman
中科院分区：
文献类型：
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作者：
Hailang Wang;E. Salman
在这篇简报中，我们将重新讨论用于估计I/O驱动器同时开关引起的电源噪声的封闭式表达式。它表明，现有的封闭形式的表达式共享一个共同的限制和低估噪声高达83%的误差，在先进的纳米级技术与快速的信号上升/下降时间。这一特点进行了研究，定量和定性。新的封闭形式的表达式开发的快速过渡时间的信号。结果表明，所提出的封闭形式的表达式表现出的平均误差为3.3%，与SPICE模拟相比，并提高了现有的表达式的准确性高达79.4%。
Closed-form expressions to estimate power supply noise due to the simultaneous switching of I/O drivers are revisited in this brief. It is shown that existing closed-form expressions share a common limitation and underestimate noise with up to 83% error in advanced nanoscale technologies with fast signal rise/fall times. This characteristic is investigated, both quantitatively and qualitatively. New closed-form expressions are developed for the signals with fast transition times. Results demonstrate that the proposed closed-form expressions exhibit an average error of 3.3% as compared with SPICE simulations, and enhance the accuracy of the existing expressions by up to 79.4%.