Measurements of x‐ray diffraction for liquid metals under high pressure
Measurements of x‐ray diffraction for liquid metals under high pressure
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高压液态金属的 X 射线衍射测量
DOI:
10.1063/1.1140736
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发表时间:
1989
影响因子:
1.6
通讯作者:
T. Kikegawa
中科院分区:
文献类型:
--
作者:
K. Tsuji;K. Yaoita;M. Imai;O. Shimomura;T. Kikegawa
By using synchrotron radiation with high brightness, high energy, and continuous spectrum in energy, x‐ray diffraction for liquid metals has been measured at pressures to 9 GPa and temperatures to 800 °C by a transmitting and energy‐dispersive method. A cubic‐type apparatus for high‐pressure and high‐temperature experiments was used. A thick specimen could be used as the absorption coefficient was small for high energy x rays (40–120 keV). A sharp slit system eliminated the background intensity from the pressure‐transmitting medium and the sample container. This method has been applied to the investigation of pressure‐induced structural changes in liquid selenium, gallium, and bismuth.