An electro-polishing technique for the preparation of metal specimens for transmission electron microscopy
An electro-polishing technique for the preparation of metal specimens for transmission electron microscopy
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一种用于制备透射电子显微镜金属样品的电抛光技术
DOI：
10.1080/14786435808237025
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发表时间：
1958
期刊：
影响因子：
--
通讯作者：
H. Tomlinson
中科院分区：
文献类型：
--
作者：
H. Tomlinson
摘要 描述了通过电抛光生产薄金属样品以供透射电子显微镜检查的条件。该方法已应用于镁、钴、铜、镍、铝、α-黄铜和铁，并给出了显示位错排列和运动的代表性显微照片。给出了一些与使用透射电子显微镜技术研究金属位错相关的实用提示。
Abstract The conditions are described under which thin metal specimens can be produced by electro-polishing for examination by transmission electron microscopy. The method has been applied to Mg, Co, Cu, Ni, Al, α-brass and Fe, and representative micrographs showing the arrangement and movement of the dislocations are presented. Some practical hints are given relating to the use of the transmission electron-microscope technique for the study of dislocations in metals.