Scanning positron microbeam
Scanning positron microbeam
复制标题
扫描正电子微束
DOI：
10.1063/1.1140231
复制
发表时间：
1988
影响因子：
1.6
通讯作者：
A. Mills
中科院分区：
文献类型：
--
作者：
G. Brandes;K. Canter;T. Horsky;P. Lippel;A. Mills
报道了扫描正电子微束的构造和操作。正电子是从归一化每伏亮度为 1.8×105 e+ s−1 cm−2 rad−2 V−1 Ci−1 的双重重构正电子束获得的。 8000 e+ s−1 的光束通过扇形透镜聚焦到 10×50 μm2 焦点，并在测试网格上进行扫描。将讨论缺陷光谱学和小样品观察的可能应用。
The construction and operation of a scanning positron microbeam is reported. The positrons are obtained from a doubly remoderated positron beam with a normalized brightness‐per‐volt of 1.8×105 e+ s−1 cm−2 rad−2 V−1 Ci−1. The beam of 8000 e+ s−1 is brought to a 10×50 μm2 focus by a sectored lens and is scanned across a test grid. Possible applications to defect spectroscopy and the observation of small samples will be discussed.