In situ synchrotron x-ray photon beam characterization
In situ synchrotron x-ray photon beam characterization
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DOI：
10.1063/1.2711150
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发表时间：
2007-03
影响因子：
3.2
通讯作者：
Nicholas R. Kyele;R. V. Silfhout;S. Manolopoulos;S. Nikitenko
中科院分区：
文献类型：
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作者：
Nicholas R. Kyele;R. V. Silfhout;S. Manolopoulos;S. Nikitenko
我们研究了两种原位测量X射线束参数，如积分强度，位置和强度分布的方法。这些几乎透明的方法都依赖于从薄的无定形箔收集散射辐射。这些方法测量的是光束的横截面图像，而不是现有的原位检测方法提供的轮廓或光束质心位置。我们提出了在第三代同步辐射光源的测量结果，并提供推导光束的轮廓，位置和绝对强度的分析方法。
We have investigated two in situ methods of measuring x-ray beam parameters such as integrated intensity, position, and intensity distribution. These virtually transparent methods both rely on the collection of scattered radiation from a thin amorphous foil. The scattered radiation is collected by an active pixel sensor placed below the foil, well out of the direction of the beam path. These methods measure a cross-sectional image of the beam as opposed to a profile or beam centroid position provided by existing in situ detection methods. We present the results of measurements taken at a third generation synchrotron radiation source and provide analytical methods of deriving beam profile, position, and absolute intensity.