Use of Leaf Optical Properties in Plant Stress Research
Use of Leaf Optical Properties in Plant Stress Research
复制标题
叶片光学特性在植物逆境研究中的应用
DOI:
10.1021/bk-1984-0257.ch018
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发表时间:
1984
期刊:
影响因子:
--
通讯作者:
J. Quisenberry
中科院分区:
文献类型:
--
作者:
H. Gausman;J. Burke;J. Quisenberry
Leaf reflectance may become a "diagnostic tool" to detect plant stress in three areas: chlorophyll absorption (0.45- to 0.75- µm waveband), near-infrared (0.75- to 1.35- µm waveband), and infrared-water absorption (1.35- to 2.5- µm waveband) spectral regions. Stress may either increase or decrease leaf total chlorophyll concentration: low chlorophyll concentrations usually cause a higher reflectance at 0.55- µm than higher concentrations. Furthermore, stress inhibts leaf expansion. A stressed leaf's mesophyll remains compact and consequently has a lower reflectance than a "nonstressed" leaf that has a lacunose mesophyll. The higher near-infrared light reflectance for a nonstressed leaf is caused by more light scattering, when light goes from hydrated cell walls (refractive index of 1.4) into airspaces (refractive index of 1.0). Moreover, water absorbs infrared light energy within the 1.35- to 2.5- µm waveband: leaves with high water content have lower reflectance than do leaves with lower water content. Practical aspects are reviewed.