Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films
Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films
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DOI：
10.1063/1.3290247
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发表时间：
2010-01
影响因子：
4
通讯作者：
Yunseok Kim;W. Kim;Hyunwoo Choi;Seungbum Hong;Hyungsoo Ko;Hee-Chul Lee;K. No
中科院分区：
文献类型：
--
作者：
Yunseok Kim;W. Kim;Hyunwoo Choi;Seungbum Hong;Hyungsoo Ko;Hee-Chul Lee;K. No
利用压电响应力显微镜研究了聚偏氟乙烯-三氟乙烯铁电薄膜的纳米畴生长动力学。采用旋涂法在Au衬底上制备了90 nm厚的铁电聚合物薄膜。纳米点阵图形的畴大小与脉冲宽度的对数值成线性关系。然而，有一个显着的不对称性的成核和横向畴生长取决于电压极性，这意味着存在的首选极化状态。所得到的激活场表明铁电聚合物薄膜具有成核限制的畴变行为。
Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films were investigated by piezoresponse force microscopy. A 90 nm thick ferroelectric polymer thin films were fabricated on Au substrate by spin-coating method. The domain size of nanoscale dot pattern was linearly proportional to logarithmic value of the pulse width. However there was a significant asymmetry in nucleation and lateral domain growth depending on the voltage polarity, which implies the existence of the preferred polarization states. The obtained activation field indicates the nucleation-limited domain switching behaviors of ferroelectric polymer thin films.