Deformation behaviour of an advanced nickel-based superalloy studied by neutron diffraction and electron microscopy
Deformation behaviour of an advanced nickel-based superalloy studied by neutron diffraction and electron microscopy
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DOI:
10.1016/j.actamat.2012.09.005
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发表时间:
2012-11-01
期刊:
影响因子:
9.4
通讯作者:
Preuss, Michael
中科院分区:
文献类型:
--
作者:
Grant, Benedict M. B.;Francis, Elisabeth M.;Preuss, Michael
Deformation mechanisms under tensile loading at room temperature have been studied in a polycrystalline nickel-based superalloy containing close to 50 vol.% gamma'. In order to identify the effect of gamma' particle size on deformation mechanisms, model microstructures with unimodal gamma' size distributions were developed. The investigations were carried out by combining in situ loading experiments using neutron diffraction and two-site elasto-plastic self-consistent plasticity modelling with detailed post-mortem electron microscopy. The microscopy work also includes results for samples strained at 500 degrees C. During early plastic deformation, the diffraction data demonstrate that gamma and gamma' display the same elastic strain response, indicating that at this stage gamma' is cut by dislocations regardless of the gamma' particle size. Scanning electron microscopy studies showed an abundance of shearing processes in all three microstructures, hence supporting the conclusions drawn from the diffraction experiment. As the material is further deformed, elastic load transfer from gamma to gamma' was observed in the medium (130 nm) and coarse (230 nm) gamma' microstructures but not in the fine (90 nm) gamma' microstructure. The load transfer can be explained by assuming that Orowan looping becomes an additional operative deformation mode. Transmission electron microscopy confirmed that in the fine gamma' microstructure deformation takes place by strongly coupled dislocations cutting the gamma', while the medium and coarse gamma' microstructures showed additional signs of Orowan looping. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.