Measurements of π±, K± and proton double differential yields from the surface of the T2K replica target for incoming 31 GeV/c protons with the NA61/SHINE spectrometer at the CERN SPS
Measurements of π±, K± and proton double differential yields from the surface of the T2K replica target for incoming 31 GeV/c protons with the NA61/SHINE spectrometer at the CERN SPS
复制标题
使用 CERN SPS 的 NA61/SHINE 光谱仪测量 T2K 复制靶表面输入的 31 GeV/c 质子的 π±、K± 和质子双微分产率
DOI：
10.1140/epjc/s10052-019-6583-0
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发表时间：
2019
期刊：
影响因子：
--
通讯作者：
et. al.
中科院分区：
文献类型：
--
作者：
Takuya Hasegawa;et. al.
使用2010年运行期间收集的数据，在CERN SPS上用NA 61/SHINE光谱仪对90-长碳靶（T2 K复制品）表面发射的、和质子双微分产额进行了测量。与先前发表的NA 61/SHINE结果相比，测量的双差示产额的精度提高了，同时首次获得了和质子产额。提出了一种处理入射质子束轮廓上的结果的依赖性的策略。这些测量的目的是通过限制来自T2 K目标的（反）中微子祖先的产生来显著降低T2 K长基线中微子实验中的（反）中微子通量不确定性。
Measurements of the,, and proton double differential yields emitted from the surface of the 90--long carbon target (T2K replica) were performed for the incomingprotons with the NA61/SHINE spectrometer at the CERN SPS using data collected during 2010 run. The double differentialyields were measured with increased precision compared to the previously published NA61/SHINE results, while theand proton yields were obtained for the first time. A strategy for dealing with the dependence of the results on the incoming proton beam profile is proposed. The purpose of these measurements is to reduce significantly the (anti)neutrino flux uncertainty in the T2K long-baseline neutrino experiment by constraining the production of (anti)neutrino ancestors coming from the T2K target.