Femtosecond laser induced ablation of crystalline silicon upon double beam irradiation
Femtosecond laser induced ablation of crystalline silicon upon double beam irradiation
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DOI:
10.1016/s0169-4332(02)00400-2
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发表时间:
2002-09
影响因子:
6.7
通讯作者:
T. Choi;D. Hwang;C. Grigoropoulos
中科院分区:
文献类型:
--
作者:
T. Choi;D. Hwang;C. Grigoropoulos
Ultra-short pulsed laser radiation has been shown to be effective for precision materials processing. Advantages include the non-thermal nature of ablation process and short thermal penetration depth. These are ideal characteristics for precision microstructuring and controlled ablation. A crystalline silicon sample is subjected to two optically separated ultra-fast laser pulses of full width half maximum (FWHM) duration of about 80 fs. These pulses are delivered at wavelength λ=800nm by a solid-state laser pumped Ti:Al2O3femtosecond oscillator seeding a regenerative amplifier. Femtosecond-resolved imaging pump-and-probe experiments in reflective and Schlieren configurations have been performed to investigate plasma dynamics and shock wave propagation during the sample ablation process.