Ionic fragmentation of SF6 ionised in the sulphur 2p shell
Ionic fragmentation of SF6 ionised in the sulphur 2p shell
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硫 2p 壳层中电离的 SF6 的离子碎裂
DOI：
10.1088/0022-3700/11/18/017
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发表时间：
1978
期刊：
影响因子：
--
通讯作者：
M. J. V. Wiel
中科院分区：
文献类型：
--
作者：
A. Hitchcock;C. E. Brion;M. J. V. Wiel
通过电子-离子符合技术研究了 160 至 230 eV 激发后 SF6 的离子碎裂。观察到的碎片已分为价壳部分和内壳部分（S 2p）。证明了所有硫 2p 电离连续体的恒定离子碎片模式，包括 184 和 196 eV 处的明显结构。讨论了该结果对这些结构的各种描述的重要性。 SF6 的吸收振荡器强度从 5 到 230 eV，源自小动量转移时的前向散射电子能量损失测量，还报告了该强度并与早期的光学数据进行了比较。最后，离子自相关谱表明双离解电离过程（约占 8 keV 电子撞击所有电离事件的 2%）对高度激发的 SF6 衰变的贡献相对较大。
The ionic fragmentation of SF6 following excitations between 160 and 230 eV has been studied by the electron-ion coincidence technique. The observed fragmentation has been separated into valence- and inner- (S 2p) shell components. A constant ionic fragmentation pattern for all of the sulphur 2p ionisation continuum, including the pronounced structures at 184 and 196 eV, is demonstrated. The significance of this result to various descriptions of these structures is discussed. The absorption oscillator strength of SF6 from 5 to 230 eV, derived from forward-scattering electron energy-loss measurements at small momentum transfer, is also reported and compared to earlier optical data. Finally, the ion autocorrelation spectrum indicates the relatively large contribution of double dissociative-ionisation processes ( approximately 2% of all ionisation events for 8 keV electron impact) to the decay of highly excited SF6.