Simple method for measuring the azimuthal anchoring strength of nematic liquid crystals
Simple method for measuring the azimuthal anchoring strength of nematic liquid crystals
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DOI：
10.1063/1.1415344
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发表时间：
2001-10-29
影响因子：
4
通讯作者：
Galerne, Y
中科院分区：
文献类型：
--
作者：
Fonseca, JG;Galerne, Y
我们提出了一种简单的方法来测量向列相液晶在固体衬底表面的方位锚定强度和角滑动。该方法只需要对称的样品。当使用白光时，它使用干涉振荡的平均值，这使得人们可以在最小光的情况下直接从偏振器角度测量表面增量Phi的方位偏移角。然后，通过改变单元厚度，例如通过楔形单元，很容易确定方位向外推长度Xi(Phi)。作为一个例子，我们测量了5CB在沉积在抛光铟锡氧化物上的自组装单分子膜上的方位锚定强度。(C)2001年美国物理研究所。
We present a simple method for measuring the azimuthal anchoring strength and the angular gliding of nematic liquid crystals at the surface of solid substrates. The method only needs symmetrical samples. It uses the averaging of the interference oscillations when using white light, which allows one to measure the azimuthal deviation angle at the surface delta phi directly from the polarizers angles at the minimum of light. It is then easy to determine the azimuthal extrapolation length xi (phi) on varying the cell thickness, e.g., by means of wedge cells. As an example, we measure the azimuthal anchoring strength of 5CB onto self-assembled monolayers deposited onto polished indium-tin-oxide. (C) 2001 American Institute of Physics.