Projection pattern intensity control technique for 3-D optical measurement.
Projection pattern intensity control technique for 3-D optical measurement.
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DOI：
10.1364/opex.13.000106
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发表时间：
2005-01
期刊：
影响因子：
3.8
通讯作者：
Cunwei Lu;G. Cho
中科院分区：
文献类型：
--
作者：
Cunwei Lu;G. Cho
提出了一种新的投影图案控制技术，以试图解决当测量条件例如物体颜色或物体表面反射改变时不能拍摄具有理想强度分布的图像的问题。所提出的技术可以自动调整的投影图案的强度分布，根据测量条件的变化。然后可以在短时间内获得具有理想强度分布的图像，平均大约三个投影。因此，可以提高三维图像测量的速度、鲁棒性和实用性。
A new projection pattern control technique is presented in an attempt to solve the problem whereby an image having an ideal intensity distribution cannot be photographed when measurement conditions, such as object color or object surface reflection, change. The proposed technique can adjust the intensity distribution of a projection pattern automatically, according to changes in the measurement conditions. An image with an ideal intensity distribution can then be obtained in a short time, approximately three projections on average. Thus, the speed, robustness, and practicality of 3-D image measurement can be improved.