Dual-slope imaging in highly scattering media with frequency-domain near-infrared spectroscopy.
Dual-slope imaging in highly scattering media with frequency-domain near-infrared spectroscopy.
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DOI：
10.1364/ol.394829
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发表时间：
2020-08-15
期刊：
影响因子：
3.6
通讯作者：
Fantini, Sergio
中科院分区：
文献类型：
--
作者：
Blaney, Giles;Sassaroli, Angelo;Fantini, Sergio
我们提出了一种新的扩散光学成像（DOI）的方法，是基于频域近红外光谱（FD-NIRS）中的双斜率（DS）的概念的理论和实验演示。我们考虑一个特殊的阵列的源和检测器，收集强度（I）和相位（λ）数据与多个DS集。我们最近表明，DS的反射率数据具有更深的灵敏度相对于DSI反射率数据。在这里，第一次，我们描述了一个DS成像方法的基础上的Moore-Penrose逆的灵敏度矩阵多DS数据集。使用一个圆形的8源/9探测器阵列，产生16 DS数据集的源-探测器的距离在20-40 mm的范围内，我们表明，DSI图像是更敏感的表面（<5 mm）的扰动，而DS双折射图像是更敏感的更深（>10 mm）的扰动在高散射介质。
We present theoretical and experimental demonstrations of a novel diffuse optical imaging (DOI) method that is based on the concept of dual slopes (DS) in frequency-domain near-infrared spectroscopy (FD-NIRS). We consider a special array of sources and detectors that collects intensity (I) and phase (ϕ) data with multiple DS sets. We have recently shown that DSϕ reflectance data features a deeper sensitivity with respect to DSI reflectance data. Here, for the first time, we describe a DS imaging approach based on the Moore-Penrose inverse of the sensitivity matrix for multiple DS data sets. Using a circular 8-source/9-detector array that generates 16 DS data sets at source-detector distances in the range 20-40 mm, we show that DSI images are more sensitive to superficial (<5 mm) perturbations, whereas DSϕ images are more sensitive to deeper (>10 mm) perturbations in highly scattering media.