Observation of the Creations and Annihilations of Local Current Paths in HfO2 thin films on Pt by Ultrahigh Vacuum Conductive-Atomic Force Microscopy : Evidence of Oxygen SpillOver during the Forming Process
Observation of the Creations and Annihilations of Local Current Paths in HfO2 thin films on Pt by Ultrahigh Vacuum Conductive-Atomic Force Microscopy : Evidence of Oxygen SpillOver during the Forming Process
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用超高真空导电原子力显微镜观察 Pt 上 HfO2 薄膜局部电流路径的产生和消灭：形成过程中氧气溢出的证据
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
N. Sasaki
中科院分区：
文献类型：
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作者：
白石幸英;山口淳一;戸嶋直樹;N. Sasaki
