Toughening mechanisms and damage propagation in Architected-Interfaces
Toughening mechanisms and damage propagation in Architected-Interfaces
复制标题
架构接口中的增韧机制和损伤传播
DOI：
10.1016/j.ijsolstr.2023.112600
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发表时间：
2023-11-30
影响因子：
3.6
通讯作者：
Budzik，Michal K.
中科院分区：
文献类型：
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作者：
Hedvard，Michelle L. S.;Dias，Marcelo A.;Budzik，Michal K.
我们研究了结构界面的断裂韧性，以及它们保持结构完整性的能力，并提供了超过破坏载荷的稳定损伤扩展条件。我们提出了理论和数值框架来评估夹在两个(面)材料之间的结构界面的断裂特性。这些界面的微观几何形状被选择为2D单元-柱子、四面体和六边形-以及它们的3D对应单元-即柱子阵列、八位组桁架和开尔文单元。我们的模型，无论是数值模型还是解析模型，在预测失效前的柔度和失效载荷方面都表现出了很高的准确性。在损伤扩展过程中获得了新的结果，表明实现了所谓的故障安全设计。一些单元几何形状在断裂过程中展开，从而增加了破坏载荷，并确保了稳定和可控的损伤扩展条件。
We investigate fracture toughness of architected interfaces and their ability to maintain structural integrity and provide stable damage propagation conditions beyond the failure load. We propose theoretical and numerical frameworks to evaluate the fracture properties of architected interfaces sandwiched between two (face) materials. The microscopic geometries of these interfaces are chosen as 2D cells – pillar, tetrahedron, and hexagon – as well as their 3D counterparts – namely, pillar array, octet truss, and Kelvin cell. Our model, both numerical and analytical, exhibits a high level of accuracy in predicting the compliance before failure and failure loads. Novel results are obtained during the damage propagation regime, indicating fulfilment of the so-called fail-safe design. Some of the cell geometries unfold during fracture, thus increasing the failure load and ensuring stable and controlled damage propagation conditions.