Mechanical properties of three kinds of ITER-Grade pure tungsten with different manufacturing processes
Mechanical properties of three kinds of ITER-Grade pure tungsten with different manufacturing processes
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三种不同制造工艺的ITER级纯钨的机械性能
DOI：
10.1016/j.fusengdes.2020.111679
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发表时间：
2020
影响因子：
1.7
通讯作者：
T. Nozawa
中科院分区：
文献类型：
--
作者：
Ju;H. Tanigawa;D. Hamaguchi;T. Nozawa
通过维氏硬度试验、室温拉伸试验和微柱试验，对ITER级钨、中轧比斜轧和高轧比斜轧三种工艺制备的纯钨板材进行了性能评价。维氏硬度测试结果表明，所有类型的钨板的硬度值为410-430Hv，没有发现明显的数据分散。然而，拉伸试验显示出相对较大的数据分散，这在室温下尤其严重。同时，为了确定试件切割位置沿板厚方向(S方向)的影响，进行了微柱试验。虽然数据有一定的离散性，但试验结果显示有塑性变形，切割位置没有明显的影响。因此，认为试件切割位置不会影响拉伸试验中确定的数据离散度。或者，如此大的色散可能是表面主体结构的部分分离。这种特殊的微观结构会使裂纹路径更加复杂，导致数据分散。
Pure tungsten plates with three kinds of manufacturing processes, i.e., ITER-Grade tungsten, cross-rolled tungsten with a moderate rolling ratio and another cross-rolled tungsten with a high rolling ratio, were evaluated by the Vickers hardness test, tensile test at room temperature and 500 °C, and micro pillar test. The Vickers hardness test results showed that the hardness value of all types of the tungsten plates was 410–430 Hv and no significant data dispersion was identified. However, the tensile test showed comparably large data dispersion, which was particularly drastic at room temperature. In parallel, to determine the effect of the specimen cut location thorough the plate thickness direction (S-Direction), micro pillar tests were conducted. Although there were some data dispersion, test results showed plastic deformation and no marked effect of the cut location was identified. It is therefore believed that the specimen cut location did not affect the data dispersion identified in the tensile test. Alternatively, the probable explanation for such large dispersion is partial detachment of the surface bulk structure. Such specific microstructure can make crack paths more complicated, resulting in the data dispersion.