Nonlinear scanning laser microscopy by third harmonic generation
Nonlinear scanning laser microscopy by third harmonic generation
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DOI：
10.1063/1.118442
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发表时间：
1997-02-24
影响因子：
4
通讯作者：
Silberberg, Y
中科院分区：
文献类型：
--
作者：
Barad, Y;Eisenberg, H;Silberberg, Y
在聚焦光束的焦点附近产生的三次谐波被用来探测透明样品的显微结构。结果表明，该方法可以解决接口和轴向分辨率可比的光束的共焦长度的不均匀性。使用120 fs脉冲在1.5 μ m，我们能够解决接口的分辨率为1.2 μ m。还制作了二维横截面图像。(C)1997年美国物理学会。
Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. It is shown that this method can resolve interfaces and inhomogeneities with axial resolution comparable to the confocal length of the beam. Using 120 fs pulses at 1.5 mu m, we were able to resolve interfaces with a resolution of 1.2 mu m. Two-dimensional cross-sectional images have also been produced. (C) 1997 American Institute of Physics.