SHAKE-OFF ON INNER-SHELL RESONANCES OF Ar, Kr, AND Xe
SHAKE-OFF ON INNER-SHELL RESONANCES OF Ar, Kr, AND Xe
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Ar、Kr 和 Xe 内壳共振的摆脱
DOI：
10.1088/0022-3700/20/19/013
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发表时间：
1987
期刊：
影响因子：
--
通讯作者：
R. Wehlitz
中科院分区：
文献类型：
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作者：
P. Heimann;D. Lindle;T. Ferrett;S. Liu;L. Medhurst;M. Piancastelli;D. A. Shirley;U. Becker;H. Kerkhoff;B. Langer;D. Szostak;R. Wehlitz
使用同步辐射将内壳层电子激发到Ar 2p 至ns、nd、Kr 3d 至np 和Xe 4d 至n p 共振的里德伯轨道。通过三种不同的电子测量研究了振动通道的共振衰减。首先，在共振和阈值上获得阈值电子扫描。在每个原子的第一次共振时，收集光电子能谱。还确定了一些共振的低动能电子的强度分布。最后，进行了摇动计算，并与实验的摇动概率进行了比较。据观察，抖落是这些共振的强衰减通道。
Synchrotron radiation was used to excite an inner-shell electron into a Rydberg orbital at the Ar 2p to ns, nd, Kr 3d to np and Xe 4d to n p resonances. The resonant decay into shake-off channels was studied by three different electron measurements. Firstly, threshold electron scans were obtained over the resonances and thresholds. On the first resonance for each atom, photoelectron spectra were collected. The intensity distribution of low kinetic energy electrons was also determined for a few resonances. Finally, a shake calculation was carried out to compare with the experimental shake-off probabilities. Shake-off is observed to be a strong decay channel for these resonances.