A compact imaging system with a CdTe double-sided strip detector for non-destructive analysis using negative muonic X-rays
A compact imaging system with a CdTe double-sided strip detector for non-destructive analysis using negative muonic X-rays
复制标题
DOI：
10.1016/j.nima.2017.11.004
复制
发表时间：
2018-12-21
影响因子：
1.4
通讯作者：
Yabu, Goro
中科院分区：
文献类型：
--
作者：
Katsuragawa, Miho;Tampo, Motonobu;Yabu, Goro
碲化镉双面条带探测器（CdTe-DSD）是10 keV以上硬X射线成像和光谱测量的理想器件。最近的发展使我们能够实现具有类似于10 cm（2）的检测面积的成像器。探测器的能量分辨率为1- 2keV（FWHM），位置分辨率为几百μ m。这种类型的成像仪一直期待着非破坏性元素分析，特别是通过使用负μ子，因为μ子原子的特征X射线的能量比正常原子的能量高约200倍。利用负μ子的方法，硬X射线信息给出了由μ子束的初始动量定义的一定深度处样品中元素的空间分布。为了研究该方法的三维成像能力，我们已经开发了一个紧凑的成像系统的基础上的CdTe-DSD和一个φ 3 mm针孔准直器作为第一个原型。我们在MUSE/J-PARC中进行了由Al、BN和LiF层组成的样品在负μ子束辐照下的实验，并成功地重建了不同深度处来自B、N和F的μ子X射线的硬X射线图像。(C)2017爱思唯尔B. V.保留所有权利。
A CdTe double-sided strip detector (CdTe-DSD) is an ideal device for imaging and spectroscopic measurements in the hard X-ray range above 10 keV. Recent development enables us to realize an imager with a detection area of similar to 10 cm(2). An energy resolution of 1-2 keV (FWHM) and a position resolution of a few hundred mu m are available from the detector. This type of imager has been long awaited for non-destructive elemental analysis, especially by using negative muons, because energies of characteristic X-rays from muonic atoms are about 200 time higher than those from normal atoms. With the method that uses negative muons, hard X-ray information gives the spatial distribution of elements in samples at a certain depth defined by the initial momentum of the muon beam. In order to study three-dimensional imaging capability of the method, we have developed a compact imaging system based on CdTe-DSD and a phi 3 mm pinhole collimator as the first prototype. We conducted experiments with samples which consist of layers of Al, BN and LiF irradiated by negative muon beams in MUSE/J-PARC and successfully reconstruct hard X-ray images of muonic X-rays from B, N and F at various depths. (C) 2017 Elsevier B.V. All rights reserved.