COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY
COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY
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DOI：
10.1063/1.106940
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发表时间：
1992-05-18
影响因子：
4
通讯作者：
WEINER, JS
中科院分区：
文献类型：
--
作者：
BETZIG, E;FINN, PL;WEINER, JS
A distance regulation method has been developed to enhance the the reliability, versatility, and ease of use of near-field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near-field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near-field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.
