Simulation of Time-of-Flight Sensors for Evaluation of Chip Layout Variants
Simulation of Time-of-Flight Sensors for Evaluation of Chip Layout Variants
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DOI：
10.1109/jsen.2015.2409816
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发表时间：
2015-07-01
影响因子：
4.3
通讯作者：
Kolb, Andreas
中科院分区：
文献类型：
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作者：
Lambers, Martin;Hoberg, Stefan;Kolb, Andreas
飞行时间（ToF）传感器的仿真主要用于评估深度数据处理算法，因此，现有的方法主要集中在真实深度数据的生成上。因此，目前的方法是有限的有用的研究替代传感器芯片设计，因为这个应用领域有不同的要求。我们提出了一个新的基于物理的仿真模型，重点是现实和实用的传感器参数化。该模型适用于在大规模并行处理器（如图形处理单元）上实现，以允许在广泛的参数集上快速模拟许多传感器帧，从而进行有意义的评估。我们使用我们的实现来评估连续波ToF传感器设计中的两种替代方法。
Simulation of time-of-flight (ToF) sensors has mainly been used to evaluate depth data processing algorithms, and existing approaches, therefore, focus on the generation of realistic depth data. Thus, current approaches are of limited usefulness for studying alternatives in sensor chip design, since this application area has different requirements. We propose a new physically based simulation model with a focus on realistic and practical sensor parameterization. The model is suitable for implementation on massively parallel processors such as graphics processing units, to allow fast simulation of many sensor frames across a wide range of parameter sets for meaningful evaluation. We use our implementation to evaluate two alternative approaches in continuous-wave ToF sensor design.