Local-structure analysis around dopant atoms using multiple energy x-ray holography
Local-structure analysis around dopant atoms using multiple energy x-ray holography
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DOI:
10.1103/physrevb.63.041201
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发表时间:
2001-01-15
影响因子:
3.7
通讯作者:
Ishii, M
中科院分区:
文献类型:
--
作者:
Hayashi, K;Matsui, M;Ishii, M
We used multiple energy x-ray holography (MEXH) to image the local atomic environment of Zn atoms doped in a GaAs wafer using synchrotron radiation and a multielement solid-state detector. The obtained atomic images revealed that the Zn atoms occupied substitutional site. By the comparison of the reconstructed images 1.41 Angstrom above and below the emitter atom, the suppression of twin images due to MEXH was confirmed experimentally for certain atoms.