Fabrication of periodically poled AlN with sub-micron periods
Fabrication of periodically poled AlN with sub-micron periods
复制标题
具有亚微米周期的周期性极化 AlN 的制造
DOI:
10.1002/pssc.201001163
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发表时间:
2011
期刊:
影响因子:
--
通讯作者:
M. Wraback
中科院分区:
文献类型:
--
作者:
Jonathan Wright;C. Moe;A. Sampath;G. Garrett;M. Wraback
We report on the fabrication of periodically poled AlN structures using inductive coupled plasma (ICP) etching and plasma-assisted molecular beam epitaxy (PAMBE). Periodically poled AlN structures are fabricated by first depositing Al polar material on c-plane sapphire substrates and then inverting the polarity through Mg overdoping. Subsequently, a grating with periods between 250 and 750 nm is defined by e-beam lithography and etched into the film by inductive coupled plasma etching to expose stripes of Al-polar material. ICP etching was optimized to produce vertical sidewalls and smooth Al-polar regions. Finally, the patterned substrate is regrown by PAMBE to realize a periodically poled AlN structure. The sharpness of the interface between the Al and N polar regions is found to be dependent upon ICP etch conditions and III-V flux during regrowth. Under III-rich conditions, the alignment of the grating with crystallographic orientation has an important role in the final surface morphology. While lower III-V flux ratios prevent faceting, regrowth of Al-polar material is inhibited near the sidewalls of trenches with high aspect ratios. (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)