Scanning Mueller polarimetric microscopy
Scanning Mueller polarimetric microscopy
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DOI：
10.1364/ol.41.004336
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发表时间：
2016-09-15
期刊：
影响因子：
3.6
通讯作者：
Le Grand, Yann
中科院分区：
文献类型：
--
作者：
Le Gratiet, Aymeric;Dubreuil, Matthieu;Le Grand, Yann
在商用激光扫描显微镜上实现了全米勒偏振计。这种新型偏振显微镜是基于高速偏振调制的光谱编码，使用波长扫描激光器作为光源。报告了该装置的校准和测量误差的估计。以扫描显微镜的速度获取穆勒图像是第一次被证明。矿物和生物样品的穆勒图像说明了这种新的偏振显微镜。(C) 2016年美国光学学会
A full Mueller polarimeter was implemented on a commercial laser-scanning microscope. The new polarimetric microscope is based on high-speed polarization modulation by spectral coding using a wavelength-swept laser as a source. Calibration as well as estimation of the measurement errors of the device are reported. The acquisition of Mueller images at the speed of a scanning microscope is demonstrated for the first time. Mueller images of mineral and biological samples illustrate this new polarimetric microscopy. (C) 2016 Optical Society of America