Quantitative phase imaging via Fourier ptychographic microscopy.

Quantitative phase imaging via Fourier ptychographic microscopy.
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DOI:
10.1364/ol.38.004845
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发表时间:
2013-11-15
期刊:
影响因子:
3.6
通讯作者:
Zheng G
Zheng G
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Ou X;Horstmeyer R;Yang C;Zheng G

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傅立叶重叠关联显微镜(FPM)是最近发展起来的一种成像方式,它使用角度变化的照明来扩展系统的性能,超出其光学元件所定义的限制。FPM技术采用了一种新的相位恢复过程,以实现分辨率增强和复杂的图像恢复。在这封信中,我们比较FPM数据的理论预测和相移数字全息测量,以表明其获得的相位图是定量的和无伪影。我们还探讨了可实现的空间和光学厚度分辨率之间的关系提供了一个重建的FPM相位图像。最后,我们展示了增强的可视化和收集,否则无法观察到的样本信息使用FPM的定量阶段。
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system’s performance beyond the limit defined by its optical components. The FPM technique applies a novel phase-retrieval procedure to achieve resolution enhancement and complex image recovery. In this Letter, we compare FPM data to theoretical prediction and phase-shifting digital holography measurement to show that its acquired phase maps are quantitative and artifact-free. We additionally explore the relationship between the achievable spatial and optical thickness resolution offered by a reconstructed FPM phase image. We conclude by demonstrating enhanced visualization and the collection of otherwise unobservable sample information using FPM’s quantitative phase.