Quantitative phase imaging via Fourier ptychographic microscopy.
Quantitative phase imaging via Fourier ptychographic microscopy.
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DOI:
10.1364/ol.38.004845
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发表时间:
2013-11-15
期刊:
影响因子:
3.6
通讯作者:
Zheng G
中科院分区:
文献类型:
--
作者:
Ou X;Horstmeyer R;Yang C;Zheng G
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system’s performance beyond the limit defined by its optical components. The FPM technique applies a novel phase-retrieval procedure to achieve resolution enhancement and complex image recovery. In this Letter, we compare FPM data to theoretical prediction and phase-shifting digital holography measurement to show that its acquired phase maps are quantitative and artifact-free. We additionally explore the relationship between the achievable spatial and optical thickness resolution offered by a reconstructed FPM phase image. We conclude by demonstrating enhanced visualization and the collection of otherwise unobservable sample information using FPM’s quantitative phase.