Core Ionization Initiates Subfemtosecond Charge Migration in the Valence Shell of Molecules
Core Ionization Initiates Subfemtosecond Charge Migration in the Valence Shell of Molecules
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DOI：
10.1103/physrevlett.117.093002
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发表时间：
2016-08-23
影响因子：
8.6
通讯作者：
Cederbaum, Lorenz S.
中科院分区：
文献类型：
--
作者：
Kuleff, Alexander I.;Kryzhevoi, Nikolai V.;Cederbaum, Lorenz S.
在价电子电离后，产生的空穴可以超快地从分子的一端迁移到另一端。由于阿秒脉冲技术的出现，对电荷迁移的测量和理解已成为阿秒科学的中心课题。在这里，我们提出了迄今尚未考虑的问题，电离核心电子是否也会导致电荷迁移。它被发现，在核心中创建的孔保持不变，但在响应这个孔有趣的电子动力学发生，这可能导致强烈的电荷迁移的价层。这种迁移通常比价电子电离后的迁移更快，并且比俄歇过程中核心空穴的自然衰变在更短的时间尺度上发生，这使得阿秒科学非常具有挑战性。
After the ionization of a valence electron, the created hole can migrate ultrafast from one end of the molecule to another. Because of the advent of attosecond pulse techniques, the measuring and understanding of charge migration has become a central topic in attosecond science. Here, we pose the hitherto unconsidered question whether ionizing a core electron will also lead to charge migration. It is found that the created hole in the core stays put, but in response to this hole interesting electron dynamics takes place which can lead to intense charge migration in the valence shell. This migration is typically faster than that after the ionization of a valence electron and transpires on a shorter time scale than the natural decay of the core hole by the Auger process, making the subject very challenging to attosecond science.