A SEMI-EMPIRICAL METHOD OF ABSORPTION CORRECTION

A SEMI-EMPIRICAL METHOD OF ABSORPTION CORRECTION
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DOI:
10.1107/s0567739468000707
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发表时间:
1968-01-01
期刊:
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY
影响因子:
--
通讯作者:
MATHEWS, FS
MATHEWS, FS
中科院分区:
其他
文献类型:
--
作者:
NORTH, ACT;PHILLIPS, DC;MATHEWS, FS

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Furnas的方法的扩展。当晶体绕测角计轴旋转时,轴向反射强度的变化被用来给出相应倒易晶格能级的相对透射率T对方位角φ的曲线。任何一般反射hkl的透射系数近似地由T(hkl)= [T(φinc)+ T(φret)]/2给出,其中φinc和φret是入射光束和反射光束的方位角。导出了(φinc)和(φret)的方程,并讨论了该方法的精度。
An extension of Furnas's method is described. The variation of intensity of an axial reflection as the crystal is rotated about the goniometer axis is used to give a curve of relative transmission T against azimuthal angle φ for the corresponding reciprocal lattice level. Transmission coefficients for any general reflexion hkl are then given approximately by T(hkl) = [T(φinc) + T(φret)]/2 where φinc and φret are the azimuthal angles of the incident and reflected beams. Equations are derived for (φinc and φret and the accuracy of the method is discussed.