Conductivity Measurements of Stilbene-Based Molecules Incorporated into Self-Assembled Monolayers by Conducting Probe Atomic Force Microscopy
Conductivity Measurements of Stilbene-Based Molecules Incorporated into Self-Assembled Monolayers by Conducting Probe Atomic Force Microscopy
复制标题
通过探针原子力显微镜测量掺入自组装单层的二苯乙烯基分子的电导率
DOI：
10.1143/jjap.43.4511
复制
发表时间：
2004
影响因子：
1.5
通讯作者：
W. Mizutani
中科院分区：
文献类型：
--
作者：
H. Azehara;T. Liang;T. Ishida;Y. Naitoh;W. Mizutani
我们描述了一种利用导电探针原子力显微镜（CP-AFM）技术获取金属-分子-金属结的电流-电压（I-V）特性的技术。为了有效地进行重复实验，我们利用了CP-AFM系统的电流成像隧道光谱（CITS）模式。我们在Au（111）基底上制备了1-癸烷醇（1-decanethethyl）自组装单分子膜，其中引入了4，4 '-双（巯基甲基）-反式二苯乙烯（BMMS）分子。我们证明，我们已经构建了一个电导率图来自一组CITS数据。在电导图中发现了可能由BMMS分子参与的电导峰，相应的I-V曲线显示出电流的波动。文中还讨论了电流波动的原因。
We describe a technique for acquiring current-voltage (I–V) characteristics of a metal-molecule-metal junction using a conducting probe atomic force microscopy (CP-AFM) technique. To conduct a repetitive experiment efficiently, we have utilized the current imaging tunneling spectroscopy (CITS) mode of the CP-AFM system. We have prepared a self-assembled monolayer of 1-decanethiol on Au(111) substrate where 4,4'-bis(mercaptomethyl)-trans-stilbene (BMMS) molecules have been incorporated. We demonstrate that we have constructed a conductivity map derived from a set of CITS data. Conductance peaks presumably involved by BMMS molecules have been found in the conductivity map and the corresponding I–V curves have exhibited fluctuations in current. The causes of the current fluctuations are also discussed.