A method for storing fail bit maps in burn-in memory testers
A method for storing fail bit maps in burn-in memory testers
复制标题
一种在老化存储器测试仪中存储失效位图的方法
DOI：
10.1109/delta.2002.994603
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
Y. Iguchi
中科院分区：
文献类型：
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作者：
Atsumu Iseno;Y. Iguchi
尽管老化内存测试仪中的故障位图对于分析工艺问题很重要，但我们需要非常大的存储空间来存储它们。提出了一种对失效位图进行压缩并存储在缓存RAM中的方法。我们将失败模式分为六种类型。高速缓存RAM存储故障类型及其位置。由于该方法简单，因此可以很容易地在每块DUT(被测设备)板上用硬件实现。利用一片现场可编程门阵列和一块静态随机存储器研制了一台样机。
Although fail bit maps in burn-in memory testers are important for analyzing process problems, we need very large storage for storing them. This paper presented a method for compressing fail bit maps and storing them in cache RAMs. We classify fail patterns under six types. Cache RAM stores the fail types and their locations. Since the proposed method is simple, it can be easily implemented in hardware on every DUT (device under test) board. A prototype has been developed by using an FPGA and an SRAM.