Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction
Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction
复制标题
从空穴能量的角度检查负偏压温度应力引起的退化机制，以准确预测寿命
DOI：
10.1016/j.microrel.2006.06.001
复制
发表时间：
2007
期刊：
影响因子：
--
通讯作者：
T. Ohmi
中科院分区：
文献类型：
--
作者：
Kazufumi Watanabe;A. Teramoto;R. Kuroda;S. Sugawa;T. Ohmi
