Dielectric surface passivation for silicon solar cells: A review

Dielectric surface passivation for silicon solar cells: A review
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DOI:
10.1002/pssa.201700293
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发表时间:
2017-07-01
影响因子:
2
通讯作者:
Wilshaw, Peter R.
Wilshaw, Peter R.
中科院分区:
材料科学4区
文献类型:
--
作者:
Bonilla, Ruy S.;Hoex, Bram;Wilshaw, Peter R.

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Silicon wafer solar cells continue to be the leading photovoltaic technology, and in many places are now providing a substantial portion of electricity generation. Further adoption of this technology will require processing that minimises losses in device performance. A fundamental mechanism for efficiency loss is the recombination of photo-generated charge carriers at the unavoidable cell surfaces. Dielectric coatings have been shown to largely prevent these losses through a combination of different passivation mechanisms. This review aims to provide an overview of the dielectric passivation coatings developed in the past two decades using a standardised methodology to characterise the metrics of surface recombination across all techniques and materials. The efficacy of a large set of materials and methods has been evaluated using such metrics and a discussion on the current state and prospects for further surface passivation improvements is provided. (C) 2017 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim