Structure of thin block copolymer films studied by X-ray reflectivity
Structure of thin block copolymer films studied by X-ray reflectivity
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通过 X 射线反射率研究嵌段共聚物薄膜的结构
DOI：
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发表时间：
1993
期刊：
影响因子：
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通讯作者：
B. Stühn
中科院分区：
文献类型：
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作者：
R. Mutter;G. Strobl;B. Stühn
X射线反射率可用于确定聚合物薄膜的内部结构。对于聚苯乙烯和聚异戊二烯，10%的电子密度差足以区分层状结构的随机分布、平行于基底表面的完全取向和表面诱导的层状结构的形成。片层布拉格峰的消失，与加热的膜，表明过渡到无序状态。
SummaryX-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.