Tamotsu Okamoto: "Characterization of the Interface between Ga_2Se_3 Epitaxial Layr and (100) GaP Substrate by Transmission Electron Microscopy" Proc. 1st International Symposium on Control of Semiconductor Interfaces. (in press). (1993)
Tamotsu Okamoto: "Characterization of the Interface between Ga_2Se_3 Epitaxial Layr and (100) GaP Substrate by Transmission Electron Microscopy" Proc. 1st International Symposium on Control of Semiconductor Interfaces. (in press). (1993)
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Tamotsu Okamoto：“通过透射电子显微镜表征 Ga_2Se_3 外延层和 (100) GaP 衬底之间的界面”Proc。
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