Application of tip-enhanced microscopy for nonlinear Raman spectroscopy
Application of tip-enhanced microscopy for nonlinear Raman spectroscopy
复制标题
DOI:
10.1063/1.1647277
复制
发表时间:
2004-03-08
影响因子:
4
通讯作者:
Kawata, S
中科院分区:
文献类型:
--
作者:
Ichimura, T;Hayazawa, N;Kawata, S
A tip-enhanced electric field at a metallic probe tip of apertureless near-field scanning optical microscope was applied to a third-order nonlinear optical process, coherent anti-Stokes Raman spectroscopy. The combination of the enhanced field and third-order nonlinearity resolved molecular vibrations of adenine molecules embedded in deoxyribonucleic acid double-helix nanocrystals beyond the diffraction limit of light. (C) 2004 American Institute of Physics.