Determination of multiple trace element compositions in thin (<30 μm) layers of NIST SRM 614 and 616 using laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS)
Determination of multiple trace element compositions in thin (<30 μm) layers of NIST SRM 614 and 616 using laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS)
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DOI：
10.1111/j.1751-908x.2005.tb00659.x
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发表时间：
2005-01-01
影响因子：
3.8
通讯作者：
Shirasaka, M
中科院分区：
文献类型：
--
作者：
Morishita, T;Ishida, Y;Shirasaka, M
为了理解和/或避免制备成普通薄片的地质材料内的小规模化学不均匀性，在分析过程中对样品进行原位多微量元素测定并同时进行显微观察是更可取的方法。我们使用激光剥蚀电感耦合等离子体质谱仪（LA - ICP - MS），通过不同的剥蚀坑直径以及内标元素（钙和硅），对美国国家标准与技术研究院（NIST）的SRM 614和616玻璃标准物质的薄（>30μm）层中的50种微量元素进行了检测。在空间分辨率约为100μm时，在NIST SRM 614和616中发现了铊、铋、砷和镉的成分不均匀性。当剥蚀直径>50μm时，在NIST SRM 614中，除了这些元素外，大多数元素六次测定的相对标准偏差（RSD）优于10%。NIST SRM 614和616中大多数元素的测量浓度与文献中先前的值在95%置信水平上相符，但钨和铋除外。还报道了钾、砷和镉的新的激光剥蚀电感耦合等离子体质谱数据。这些结果支持这样一种观点，即最新的激光剥蚀电感耦合等离子体质谱是一种强大且灵活的分析技术，可用于测定自19世纪末以来一直用于偏振光学显微镜观察的那种普通薄片地质材料中的多种超微量元素成分。
To understand and/or avoid small-scale chemical heterogeneities within geological materials prepared as normal thin sections, in situ multiple trace element determination coupled with the simultaneous microscopic observation of the sample during analysis is preferable. We have examined fifty trace elements in thin ( > 30 mu m) layers of the NIST SRM 614 and 616 glass reference material by LA-ICP-MS using different pit diameters and internal standard elements (Ca and Si). Compositional heterogeneities of Tl, Bi, As and Cd were found in NIST SRM 614 and 616 at the spatial resolution of ca. 100 mu m. Except for these elements, the RSDs of six determinations for most elements were better than 10% in NIST SRM 614 when ablation diameters were > 50 mu m. The measured concentrations for most elements in NIST SRM 614 and 616 agree with previous values in the literature at the 95% confidence level with the exception of W and Bi. New LA-ICP-MS data for K, As and Cd are also reported. The results support the view that the latest LA-ICP-MS is a powerful and flexible analytical technique for the determination of multiple ultra-trace element compositions in geological materials prepared as normal thin sections of the type that has been used for polarising optical microscopic observations since the end of the 19th century.