An XPS and atomic force microscopy study of the micro-wetting behavior of water on pure chromium
An XPS and atomic force microscopy study of the micro-wetting behavior of water on pure chromium
复制标题
XPS 和原子力显微镜研究水对纯铬的微润湿行为
DOI：
10.2320/matertrans.44.389
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发表时间：
2003
影响因子：
1.2
通讯作者：
Naoki Morihiro
中科院分区：
文献类型：
--
作者：
R. Wang;M. Kido;Naoki Morihiro
采用X射线光电子能谱（XPS）和原子力显微镜（AFM）交流非接触模式研究了纯铬经湿法抛光、空气氧化和蒸馏水微润湿后的表面组成和形貌。通过XPS分析检测每个表面的氧化铬/氢氧化物层上的有机污染物/水层。空气氧化后，氧化物/氢氧化物层变厚，氧化物：氢氧化物比增加。在环境空气中，AFM在每个表面上显示出薄的液体层，该液体层很容易被AFM的悬臂移动，并且可以冷凝或蒸发。液体的内部部分可能是吸附的水，而外部部分被认为是有机污染物，因为液体不与通过后润湿施加的蒸馏水联合收割机结合。通过后润湿沉积的蒸馏水的微滴总是占据没有或几乎没有这种液体的位置，这可以解释所获得的比宏观润湿性更高的微观润湿性。
The surface compositions and morphologies of pure chromium after wet polishing, air oxidation and further micro-wetting by distilled water, were investigated with X-ray photoelectron spectroscopy (XPS) and the AC non-contact mode of atomic force microscope (AFM). An organic contaminants/ water layer on the chromium oxide/hydroxide layer, was detected by XPS analysis for each surface. The oxide/hydroxide layer became thicker, and the oxide : hydroxide ratio increased, after air oxidation. In ambient air, the AFM showed a thin liquid layer on each surface, which was easily moved by the cantilever of the AFM and can be condensed or evaporated. The inner part of the liquid might be adsorbed water, and the outer part is thought to be organic contaminants since the liquid did not combine with distilled water applied by post-wetting. Micro-droplets of distilled water deposited by post-wetting always occupied positions without or with little of this liquid, which might explain the obtained higher micro- than macro-wettability.